Original language | English (US) |
---|---|
Pages (from-to) | 1239 |
Number of pages | 6 |
Journal | Crystallografia |
Volume | 25 |
State | Published - 1980 |
X-ray Interference Pattern of Plan Defect
Armen Kocharian, GM Alajajian, HS Semerjian, PH Bezirganian
Research output: Contribution to journal › Article › peer-review