X-Ray Diffraction on the Thick Perfect Silicon Crystals with a Thin Lines of Deformation on the Surface

Armen Kocharian, AH Sedrakian, AA Papoian

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)33
Number of pages8
JournalAnnals of Yerevan State University
Volume4
StatePublished - 1985

Cite this