| Original language | English (US) |
|---|---|
| Pages (from-to) | 33 |
| Number of pages | 8 |
| Journal | Annals of Yerevan State University |
| Volume | 4 |
| State | Published - 1985 |
X-Ray Diffraction on the Thick Perfect Silicon Crystals with a Thin Lines of Deformation on the Surface
Armen Kocharian, AH Sedrakian, AA Papoian
Research output: Contribution to journal › Article › peer-review