Abstract
Submonolayer films of C60 have been deposited on ultrathin SiO2 films for the purpose of characterizing the initial stages of nucleation and growth as a function of temperature. Capture zones extracted from the initial film morphology were analyzed using both the gamma and generalized Wigner distributions. The calculated critical nucleus size i of the C 60 islands was observed to change over the temperature range 298 K to 483 K. All fitted values of i were found to be between 0 and 1, representing stable monomers and stable dimers, respectively. With increasing temperature of film preparation, we observed i first increasing through this range and then decreasing. We discuss possible explanations of this reentrant-like behavior.
Original language | English (US) |
---|---|
Pages (from-to) | 53-56 |
Number of pages | 4 |
Journal | Surface Science |
Volume | 606 |
Issue number | 1-2 |
DOIs | |
State | Published - Jan 2012 |
Keywords
- Capture-zone distributions
- Critical nucleus size
- Fullerenes
- Models of non-equilibrium phenomena: nucleation and growth
- Scanning tunneling microscopy
ASJC Scopus subject areas
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry