Study of CuO nanoparticle-induced cell death by high content cellular fluorescence imaging and analysis

Xiaobo Zhou, Jian Chen, Jinmin Zhu, Fuhai Li, Xudong Huang, Stephen T.C. Wong

Research output: Contribution to journalConference articlepeer-review

2 Scopus citations


To quantify cellular toxic responses to drug treatment or environmental stresses such as nanoparticles, a high throughput imaging modality with automated image analysis protocol is applied. Fluorescence images from human H4 neurogliomal cells exposed to different concentrations of CuO nanoparticles were collected by a high content fluorescence microscopy. A fully automated fluorescent cellular image analysis system has been developed for the consequential image analysis for cell viability. A data-driven background algorithm was used as adaptive multiple thresholding algorithm to categorize the cells into three classes: bright cells, dark cells, and background. Our image analysis approach includes: (1) the scale-space theory, namely Gaussian filtering with proper scale has been applied to the acquired images to generate local intensity maxima within each cell; (2) a novel method for defining local image intensity maxima based on the gradient vector field has been developed; and (3) a statistical model was proposed to overcome the problem of cell segmentation. Our data have shown that the automated image analysis protocol can achieve 90% success rate of cell detection compared to manual procedure. Cellular image analysis further indicated that H4 neuroglioma cells had a dose-dependent toxic response to the insult of CuO nanoparticles.

Original languageEnglish (US)
Article number4253279
Pages (from-to)2878-2881
Number of pages4
JournalProceedings - IEEE International Symposium on Circuits and Systems
StatePublished - 2007
Event2007 IEEE International Symposium on Circuits and Systems, ISCAS 2007 - New Orleans, LA, United States
Duration: May 27 2007May 30 2007


  • Cell death
  • CuO nanoparticle
  • H4 neuroglioma cell
  • High content cell imaging

ASJC Scopus subject areas

  • Electrical and Electronic Engineering


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