Abstract
A technique which enabled measurement of TE and TM polarised true spontaneous emission spectra of GaInP tensile strained devices, as a function of quasi-fermi level separation was presented. The technique allowed assessment of the affect of strain on significant recombination pathways within the device for a given value of gain requirement. The method, which consisted of collecting the facet emission from a multi-contact device, determined the modal gain and optical loss.
Original language | English |
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Title of host publication | Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest |
Pages | 296-297 |
Number of pages | 2 |
State | Published - Jan 1 2002 |
Event | Conference on Lasers and Electro-Optics (CLEO 2002) - Long Beach, CA, United States Duration: May 19 2002 → May 24 2002 |
Other
Other | Conference on Lasers and Electro-Optics (CLEO 2002) |
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Country/Territory | United States |
City | Long Beach, CA |
Period | 5/19/02 → 5/24/02 |
ASJC Scopus subject areas
- Physics and Astronomy(all)