@inproceedings{4e63621446234ccaa8b70ff57da1c963,
title = "Spectroscopic imaging using terahertz time-domain signals",
abstract = "Imaging systems based on terahertz time-domain spectroscopy offer a range of unique modalities due to the broad bandwidth, sub-picosecond duration, and phase-sensitive detection of the terahertz pulses. Furthermore, an exciting possibility exists to combine spectroscopic characterization and/or identification with imaging because the radiation is broadband in nature. In order to achieve this, novel methods for real-time analysis of terahertz waveforms are required. Unfortunately, both the absorption and the phase delay of a transmitted terahertz pulse vary exponentially with the sample's thickness. We describe a robust algorithm for extracting both the thickness and the complex index of refraction of an unknown sample. In contrast, most spectroscopic transmission measurements require accurate knowledge of the sample's thickness to determine the optical parameters. We also investigate the limits of our method.",
keywords = "Absorption, Bandwidth, Delay, Optical imaging, Optical pulses, Optical refraction, Phase detection, Robustness, Spectroscopy, Time domain analysis",
author = "Dorney, {T. D.} and Baraniuk, {R. G.} and Mittleman, {D. M.} and Nowak, {Robert D.}",
note = "Publisher Copyright: {\textcopyright} 2000 IEEE.; 4th IEEE Southwest Symposium on Image Analysis and Interpretation, SSIAI 2000 ; Conference date: 02-04-2000 Through 04-04-2000",
year = "2000",
doi = "10.1109/IAI.2000.839590",
language = "English (US)",
series = "Proceedings of the IEEE Southwest Symposium on Image Analysis and Interpretation",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "151--155",
booktitle = "Proceedings - 4th IEEE Southwest Symposium on Image Analysis and Interpretation",
address = "United States",
}