SEM image analysis for quality control of nanoparticles

S. K. Alexander, R. Azencott, B. G. Bodmann, A. Bouamrani, C. Chiappini, M. Ferrari, X. Liu, E. Tasciotti

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

In nano-medicine, mesoporous silicon particles provide efficient vehicles for the dissemination and delivery of key proteins at the micron scale. We propose a new quality-control method for the nanopore structure of these particles, based on image analysis software developed to automatically inspect scanning electronic microscopy (SEM) images of nanoparticles in a fully automated fashion. Our algorithm first identifies the precise position and shape of each nanopore, then generates a graphic display of these nanopores and of their boundaries. This is essentially a texture segmentation task, and a key quality-control requirement is fast computing speed. Our software then computes key shape characteristics of individual nanopores, such as area, outer diameter, eccentricity, etc., and then generates means, standard deviations, and histograms of each pore-shape feature. Thus, the image analysis algorithms automatically produce a vector from each image which contains relevant nanoparticle quality control characteristics, either for comparison to pre-established acceptability thresholds, or for the analysis of homogeneity and the detection of outliers among families of nanoparticles.

Original languageEnglish (US)
Title of host publicationComputer Analysis of Images and Patterns - 13th International Conference, CAIP 2009, Proceedings
Pages590-597
Number of pages8
DOIs
StatePublished - 2009
Event13th International Conference on Computer Analysis of Images and Patterns, CAIP 2009 - Munster, Germany
Duration: Sep 2 2009Sep 4 2009

Publication series

NameLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume5702 LNCS
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349

Other

Other13th International Conference on Computer Analysis of Images and Patterns, CAIP 2009
CountryGermany
CityMunster
Period9/2/099/4/09

ASJC Scopus subject areas

  • Theoretical Computer Science
  • Computer Science(all)

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