Abstract
We observe high contrast scanning tunneling microscope (STM)-induced luminescence maps from isolated lithographically prepared gold dots on silicon using gold and tungsten STM tips. We observe geometry-related light emission with photon intensity stronger at protrusions than in the valleys. The light intensity dependence on tunnel voltage bias agrees with theoretical predictions. A noticeable variation of onset bias with the tip material is observed.
| Original language | English (US) |
|---|---|
| Pages (from-to) | L299-L302 |
| Journal | Surface Science |
| Volume | 453 |
| Issue number | 1-3 |
| DOIs | |
| State | Published - May 10 2000 |
Keywords
- Gold
- Luminescence
- Scanning tunneling microscopy
- Surface waves
- Tungsten
ASJC Scopus subject areas
- Physical and Theoretical Chemistry
- Condensed Matter Physics
- Surfaces and Interfaces
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