Abstract
We observe high contrast scanning tunneling microscope (STM)-induced luminescence maps from isolated lithographically prepared gold dots on silicon using gold and tungsten STM tips. We observe geometry-related light emission with photon intensity stronger at protrusions than in the valleys. The light intensity dependence on tunnel voltage bias agrees with theoretical predictions. A noticeable variation of onset bias with the tip material is observed.
Original language | English (US) |
---|---|
Pages (from-to) | L299-L302 |
Journal | Surface Science |
Volume | 453 |
Issue number | 1-3 |
DOIs | |
State | Published - May 10 2000 |
Keywords
- Gold
- Luminescence
- Scanning tunneling microscopy
- Surface waves
- Tungsten
ASJC Scopus subject areas
- Physical and Theoretical Chemistry
- Condensed Matter Physics
- Surfaces and Interfaces