Scaling properties of submonolayer growth including evaporation and defects

H. Larralde, P. Jensen, M. Meunier, A. Pimpinelli

Research output: Contribution to journalConference article

Abstract

We present a model for thin film growth by particle deposition that takes into account the possible evaporation of the particles deposited on the surface as well as the effect of point defects. Our focus is on the early formation kinetics of two-dimensional islands on the surface, in particular in the scaling properties of the maximum number of islands formed on the surface. Most of our results are obtained through the analysis of rate equations describing the system. They are supported by simple scaling arguments and are confirmed by extensive computer simulations. We find significant differences with previous studies of this system which arise from different physical hypotheses concerning the mechanisms of island growth in the presence of evaporation.

Original languageEnglish (US)
Pages (from-to)253-258
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume440
StatePublished - 1997
EventProceedings of the 1996 MRS Fall Symposium - Boston, MA, USA
Duration: Dec 2 1996Dec 5 1996

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Fingerprint Dive into the research topics of 'Scaling properties of submonolayer growth including evaporation and defects'. Together they form a unique fingerprint.

Cite this