Abstract
In situ interdigitated electrode broadband dielectric spectroscopy was used to characterize the excess wing relaxations in vapor-deposited and aged glasses of methyl-m-toluate (MMT, Tg = 170 K). MMT displays typical excess wing relaxations in dielectric spectra of its supercooled liquid and glasses. Physical vapor deposition produced glasses with degrees of suppression of the excess wing relaxation that varied systematically with deposition conditions, up to a maximum suppression of more than a factor of 3. The glass deposited at a relatively high temperature, 0.96 Tg (163 K), showed the same amount of suppression as that of a liquid-cooled glass aged to equilibrium at this temperature. The suppression of the excess wing relaxation was strongly correlated with the kinetic stability of the vapor-deposited glasses. Comparisons with aged MMT glasses allowed an estimate of the structural relaxation time of the vapor-deposited glasses. The dependence of the estimated structural relaxation times upon the substrate temperature was found to be stronger than Arrhenius but weaker than Vogel-Fulcher-Tammann dependence predicted from extrapolation of relaxation times in the supercooled liquid. Additionally, this work provides the first example of the separation of primary and secondary relaxations using physical vapor deposition.
Original language | English (US) |
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Article number | 144502 |
Journal | Journal of Chemical Physics |
Volume | 151 |
Issue number | 14 |
DOIs | |
State | Published - Oct 14 2019 |
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Physical and Theoretical Chemistry