Abstract
Interferometric imaging of normal mode dynamics in electromechanical resonators, oscillating in the rf regime, is demonstrated by synchronous imaging with a pulsed nanosecond laser. Profiles of mechanical modes in suspended thin film structures and their equilibrium profiles are measured through all-optical Fabry-Perot reflectance fits to the temporal traces. As a proof of principle, the mode patterns of a microdrum silicon resonator are visualized, and the extracted vibration modes and equilibrium profile show good agreement with numerical estimations.
Original language | English (US) |
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Pages (from-to) | 2654-2656 |
Number of pages | 3 |
Journal | Optics Letters |
Volume | 35 |
Issue number | 15 |
DOIs | |
State | Published - Aug 1 2010 |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics