Abstract
Aluminum-silicon composite films consisting of a mixture of aluminum and silicon particles were produced by electron-beam coevaporation. The reflectivity of samples with APP 1STH 33-vol % Si was in good agreement with the Bruggeman theory with no adjustable parameters. No parallel-band absorption peak due to the aluminum was detected analogously to the behavior of microcrystalline aluminum films.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 1237-1240 |
| Number of pages | 4 |
| Journal | Applied Optics |
| Volume | 22 |
| Issue number | 8 |
| DOIs | |
| State | Published - Apr 15 1983 |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Engineering (miscellaneous)
- Electrical and Electronic Engineering