Aluminum-silicon composite films consisting of a mixture of aluminum and silicon particles were produced by electron-beam coevaporation. The reflectivity of samples with APP 1STH 33-vol % Si was in good agreement with the Bruggeman theory with no adjustable parameters. No parallel-band absorption peak due to the aluminum was detected analogously to the behavior of microcrystalline aluminum films.
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Engineering (miscellaneous)
- Electrical and Electronic Engineering