Abstract
Aluminum-silicon composite films consisting of a mixture of aluminum and silicon particles were produced by electron-beam coevaporation. The reflectivity of samples with APP 1STH 33-vol % Si was in good agreement with the Bruggeman theory with no adjustable parameters. No parallel-band absorption peak due to the aluminum was detected analogously to the behavior of microcrystalline aluminum films.
Original language | English (US) |
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Pages (from-to) | 1237-1240 |
Number of pages | 4 |
Journal | Applied Optics |
Volume | 22 |
Issue number | 8 |
DOIs | |
State | Published - Apr 15 1983 |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Engineering (miscellaneous)
- Electrical and Electronic Engineering