Abstract
New types of unstable homoepitaxial growth of vicinal Si(111)-(7×7) surfaces are studied using ex situ atomic force microscopy. The growth features are two types of step bunching with straight step edges between 700 and 775°C and one type of simultaneous bunching and meandering at 800°C. The results of a quantitative size scaling analysis of the straight steps are discussed from the perspective of universality classes in bunching theory.
Original language | English (US) |
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Article number | 216101 |
Journal | Physical Review Letters |
Volume | 95 |
Issue number | 21 |
DOIs | |
State | Published - Nov 18 2005 |
ASJC Scopus subject areas
- General Physics and Astronomy