Abstract
Segmentation of neural stem cells is the preliminary step to treat and cure several brain neural diseases. There exist a number of methods to accomplish this task. However, all of these methods suffer from some problems, such as high intensity variation sensitivity, human interaction and high computational complexity. In this paper we proposed a novel edge-detection-based neural stem cell image segmentation algorithm using the local complex phase characteristics. The proposed method is an illumination and contrast invariant measurement of edge significance. Our contributions are that, local weighting summation Gaussian kernel convolution and a new model for phase deviation weighting function are introduced into the proposed model to improve the local phase measurement. In experiments, we show that the proposed method is more accurate and reliable than three existing gradient-based edge detection algorithms and Kovesi's model for neural stem cell image segmentation.
Original language | English (US) |
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Title of host publication | 2010 IEEE International Conference on Image Processing, ICIP 2010 - Proceedings |
Pages | 3637-3640 |
Number of pages | 4 |
DOIs | |
State | Published - Dec 1 2010 |
Event | 2010 17th IEEE International Conference on Image Processing, ICIP 2010 - Hong Kong, Hong Kong Duration: Sep 26 2010 → Sep 29 2010 |
Other
Other | 2010 17th IEEE International Conference on Image Processing, ICIP 2010 |
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Country/Territory | Hong Kong |
City | Hong Kong |
Period | 9/26/10 → 9/29/10 |
Keywords
- Contrast invariant
- Gradient-based
- Image segmentation
- Local complex phase
- Neural stem cell
ASJC Scopus subject areas
- Software
- Computer Vision and Pattern Recognition
- Signal Processing