Nano-pore silicon membrane characterization by diffusion and electrical resistance

Andrea Carbonaro; Rob Walczak; Pasquale Mario Calderale; Mauro Ferrari

doi:10.1016/j.memsci.2004.04.039

Nano-pore silicon membrane characterization by diffusion and electrical resistance

Andrea Carbonaro, Rob Walczak, Pasquale Mario Calderale, Mauro Ferrari

Houston Methodist Hospital

Research output: Contribution to journal › Article › peer-review

14 Scopus citations

Abstract

An inexpensive, non destructive and rapid quality control (QC) procedure for nano-pore silicon membranes is presented. Membranes with different pore sizes were characterized in terms of glucose diffusion and by electrical resistance measurements. Electrical resistance results versus membrane pore size allowed to trace a reference curve to be used to verify the machining process. Diffusion was plotted versus conductance data. An experimental linear relationship was determined, which allows to predict the membrane diffusion properties without running destructive diffusion tests.

Original language	English (US)
Pages (from-to)	249-255
Number of pages	7
Journal	Journal of Membrane Science
Volume	241
Issue number	2
DOIs	https://doi.org/10.1016/j.memsci.2004.04.039
State	Published - Oct 1 2004

Keywords

Electrical conductance
Glucose diffusion
Membrane pore area
Quality control (QC)
Silicon membrane

ASJC Scopus subject areas

Filtration and Separation
Polymers and Plastics

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10.1016/j.memsci.2004.04.039

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abstract = "An inexpensive, non destructive and rapid quality control (QC) procedure for nano-pore silicon membranes is presented. Membranes with different pore sizes were characterized in terms of glucose diffusion and by electrical resistance measurements. Electrical resistance results versus membrane pore size allowed to trace a reference curve to be used to verify the machining process. Diffusion was plotted versus conductance data. An experimental linear relationship was determined, which allows to predict the membrane diffusion properties without running destructive diffusion tests.",

keywords = "Electrical conductance, Glucose diffusion, Membrane pore area, Quality control (QC), Silicon membrane",

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AU - Carbonaro, Andrea

AU - Walczak, Rob

AU - Calderale, Pasquale Mario

AU - Ferrari, Mauro

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Y1 - 2004/10/1

N2 - An inexpensive, non destructive and rapid quality control (QC) procedure for nano-pore silicon membranes is presented. Membranes with different pore sizes were characterized in terms of glucose diffusion and by electrical resistance measurements. Electrical resistance results versus membrane pore size allowed to trace a reference curve to be used to verify the machining process. Diffusion was plotted versus conductance data. An experimental linear relationship was determined, which allows to predict the membrane diffusion properties without running destructive diffusion tests.

AB - An inexpensive, non destructive and rapid quality control (QC) procedure for nano-pore silicon membranes is presented. Membranes with different pore sizes were characterized in terms of glucose diffusion and by electrical resistance measurements. Electrical resistance results versus membrane pore size allowed to trace a reference curve to be used to verify the machining process. Diffusion was plotted versus conductance data. An experimental linear relationship was determined, which allows to predict the membrane diffusion properties without running destructive diffusion tests.

KW - Electrical conductance

KW - Glucose diffusion

KW - Membrane pore area

KW - Quality control (QC)

KW - Silicon membrane

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JF - Journal of Membrane Science

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ER -

Nano-pore silicon membrane characterization by diffusion and electrical resistance

Abstract

Keywords

ASJC Scopus subject areas

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