MISSION: Ultra Large-Scale Feature Selection using Count-Sketches

Amirali Aghazadeh, Ryan Spring, Daniel Lejeune, Gautam Dasarathy, Anshumali Shrivastava, Richard G. Baraniuk

Research output: Contribution to journalConference articlepeer-review

Abstract

Feature selection is an important challenge in machine learning. It plays a crucial role in the ex-plainability of machine-driven decisions that are rapidly permeating throughout modern society. Unfortunately, the explosion in the size and dimensionality of real-world datasets poses a severe challenge to standard feature selection algorithms. Today, it is not uncommon for datasets to have billions of dimensions. At such scale, even storing the feature vector is impossible, causing most existing feature selection methods to fail. Workarounds like feature hashing, a standard approach to large-scale machine learning, helps with the computational feasibility, but at the cost of losing the interpretability of features. In this paper, we present MISSION, a novel framework for ultra large-scale feature selection that performs stochastic gradient descent while maintaining an efficient representation of the features in memory using a Count-Sketch data structure. MISSION retains the simplicity of feature hashing without sacrificing the interpretability of the features while using only O(log2 p) working memory. We demonstrate that MISSION accurately and efficiently performs feature selection on real-world, large-scale datasets with billions of dimensions.

Original languageEnglish (US)
Pages (from-to)80-88
Number of pages9
JournalProceedings of Machine Learning Research
Volume80
StatePublished - 2018
Event35th International Conference on Machine Learning, ICML 2018 - Stockholm, Sweden
Duration: Jul 10 2018Jul 15 2018

ASJC Scopus subject areas

  • Software
  • Control and Systems Engineering
  • Statistics and Probability
  • Artificial Intelligence

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