Measurement of spontaneous emission spectra of diode laser structures

G. M. Lewis, P. M. Smowton, J. D. Thomson, H. D. Summers, P. Blood

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The spontaneous emission spectra of diode laser structures were measured. The validation of the process was confirmed by comparison with the true spontaneous emission spectrum observed through a top-contact window. The spontaneous emission spectra were converted into real units, when the carrier populations were inverted at low photon energy. This method can be used to determine the spontaneous emission spectrum for TM polarized light.

Original languageEnglish (US)
Title of host publicationConference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
Pages655-656
Number of pages2
Volume2
StatePublished - 2001
Event14th Annual Meeting of the IEEE Lasers and Electro-Optics Society - San Diego, CA, United States
Duration: Nov 11 2001Nov 15 2001

Other

Other14th Annual Meeting of the IEEE Lasers and Electro-Optics Society
CountryUnited States
CitySan Diego, CA
Period11/11/0111/15/01

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Industrial and Manufacturing Engineering

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