Abstract
Recently, a real-time imaging system based on terahertz (THz) time-domain spectroscopy has been developed. This technique offers a range of unique imaging modalities due to the broad bandwidth, sub-picosecond duration, and phase-sensitive detection of the THz pulses. This paper provides a brief introduction of the state-of-the-art in THz imaging. It also focuses on expanding the potential of this new and exciting field through two major efforts. The first concentrates on improving the experimental sensitivity of the system. We are exploring an interferometric arrangement to provide a background-free reflection imaging geometry. The second applies novel digital signal processing algorithms to extract useful information from the THz pulses. The possibility exists to combine spectroscopic characterization and/or identification with pixel-by-pixel imaging. We describe a new parameterization algorithm for both high and low refractive index materials.
Original language | English (US) |
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Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
Publisher | Society of Photo-Optical Instrumentation Engineers |
Pages | 688-699 |
Number of pages | 12 |
Volume | 4115 |
DOIs | |
State | Published - 2000 |
Event | Applications of digital Image Procedding XXIII - San Diego, CA, USA Duration: Jul 31 2000 → Aug 3 2000 |
Other
Other | Applications of digital Image Procedding XXIII |
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City | San Diego, CA, USA |
Period | 7/31/00 → 8/3/00 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics