TY - GEN
T1 - Hierarchical multi-label framework for robust face recognition
AU - Zhang, Lingfeng
AU - Dou, Pengfei
AU - Shah, Shishir K.
AU - Kakadiaris, Ioannis A.
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/6/29
Y1 - 2015/6/29
N2 - In this paper, we propose a patch based face recognition framework. First, a face image is iteratively divided into multi-level patches and assigned hierarchical labels. Second, local classifiers are built to learn the local prediction of each patch. Third, the hierarchical relationships defined between local patches are used to obtain the global prediction of each patch. We develop three ways to learn the global prediction: majority voting, l1-regularized weighting, and decision rule. Last, the global predictions of different levels are combined as the final prediction. Experimental results on different face recognition tasks demonstrate the effectiveness of our method.
AB - In this paper, we propose a patch based face recognition framework. First, a face image is iteratively divided into multi-level patches and assigned hierarchical labels. Second, local classifiers are built to learn the local prediction of each patch. Third, the hierarchical relationships defined between local patches are used to obtain the global prediction of each patch. We develop three ways to learn the global prediction: majority voting, l1-regularized weighting, and decision rule. Last, the global predictions of different levels are combined as the final prediction. Experimental results on different face recognition tasks demonstrate the effectiveness of our method.
UR - http://www.scopus.com/inward/record.url?scp=84943234246&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84943234246&partnerID=8YFLogxK
U2 - 10.1109/ICB.2015.7139086
DO - 10.1109/ICB.2015.7139086
M3 - Conference contribution
AN - SCOPUS:84943234246
T3 - Proceedings of 2015 International Conference on Biometrics, ICB 2015
SP - 127
EP - 134
BT - Proceedings of 2015 International Conference on Biometrics, ICB 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 8th IAPR International Conference on Biometrics, ICB 2015
Y2 - 19 May 2015 through 22 May 2015
ER -