@inproceedings{b9a7af3c75e14a249c85c637b0188e1b,
title = "Frontiers of More than Moore in bioelectronics and the required metrology needs",
abstract = "Silicon's intersection with biology is a premise inherent in Moore's prediction. Distinct from biologically inspired molecular logic and storage devices (more Moore) are the integration of solid state electronic devices with the soft condensed state of the body (more than Moore). Developments in biomolecular recognition events per sq. cm parallel those of Moore's Law. However, challenges continue in the area of {"}More than Moore{"}. Two grand challenge problems must be addressed - the biocompatibility of synthetic materials with the myriad of tissue types within the human body and the interfacing of solid state micro- and nano-electronic devices with the electronics of biological systems. Electroconductive hydrogels have been developed as soft, condensed, biomimetic but otherwise inherently electronically conductive materials to address the challenge of interfacing solid state devices with the electronics of the body, which is predominantly ionic. Nano-templated interfaces via the oriented immobilization of single walled carbon nanotubes (SWCNTs) onto metallic electrodes have engendered reagentless, direct electron transfer between biological redox enzymes and solid state electrodes. In addressing these challenges, metrology needs and opportunities are found in such widely diverse areas as single molecule counting and addressing, sustainable power requirements such as the development of implantable biofuel cells for the deployment of implantable biochips, and new manufacturing paradigms to address plura-biology needs on solid state devices.",
keywords = "Moore, biocompatibility, bioelectronics, biointerfaces, bionics",
author = "Anthony Guiseppi-Elie and Christian Kotanen and Wilson, {A. Nolan}",
year = "2011",
doi = "10.1063/1.3657915",
language = "English (US)",
isbn = "9780735409651",
series = "AIP Conference Proceedings",
pages = "360--369",
booktitle = "Frontiers of Characterization and Metrology for Nanoelectronics",
note = "Frontiers of Characterization and Metrology for Nanoelectronics: 2011 ; Conference date: 23-05-2011 Through 26-05-2011",
}