Abstract
A technique of high voltage electron beam lithography and BCl 3/Ar reactive ion etching for laterally patterning GaAs/Al 0.3Ga0.7As multiple quantum wells is described. The resulting structures were analyzed using scanning electron microscopy and a novel reflection electron microscopy technique, and their geometries are shown. Narrow columns 40 nm in diameter etched 230 nm through the quantum wells were reproducibly fabricated.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 1284-1286 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 49 |
| Issue number | 19 |
| DOIs | |
| State | Published - 1986 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)
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