Abstract
This paper presents a review of techniques for fabricating APP GRTH 10 nm size objects by electron beam lithography and high resolution pattern transfer processes. A scanning electron microscope was used to explore the resolution limits of several organic and inorganic resists systems. With a conventional organic polymer resist on bulk semiconductor substrates, a high energy 120-kev electron beam was able to define patterns approximately 10 nm in width.
Original language | English (US) |
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Pages (from-to) | 166-168 |
Number of pages | 3 |
Journal | Journal of imaging science |
Volume | 30 |
Issue number | 4 |
State | Published - Jul 1 1986 |
ASJC Scopus subject areas
- Engineering(all)