Abstract
With careful process control and a finely focused electron beam it is possible to lithographically produce structures with dimensions on the order of tens of nanometers. We have used a high resolution scanning electron microscope to perform experiments on the lithographic process and to fabricate ultrasmall structures for physics measurements. This paper presents a review of techniques and fabricated structure along with a discussion of electron scattering and materials consideration that limit the lithographic resolution.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 353-354 |
| Number of pages | 2 |
| Journal | American Chemical Society, Polymer Preprints, Division of Polymer Chemistry |
| Volume | 26 |
| Issue number | 2 |
| State | Published - Sep 1 1985 |
ASJC Scopus subject areas
- Polymers and Plastics