Evaluation of 3D face recognition in the presence of facial expressions: An annotated deformable model approach

G. Passalis, I. A. Kakadiaris, T. Theoharis, G. Toderici, N. Murtuza

Research output: Chapter in Book/Report/Conference proceedingConference contribution

50 Scopus citations

Abstract

From a user's perspective, face recognition is one of the most desirable biometrics, due to its non-intrusive nature; however, variables such as face expression tend to severely affect recognition rates. We have applied to this problem our previous work on elastically adaptive deformable models to obtain parametric representations of the geometry of selected localized face areas using an annotated face model. We then use wavelet analysis to extract a compact biometric signature, thus allowing us to perform rapid comparisons on either a global or a per area basis. To evaluate the performance of our algorithm, we have conducted experiments using data from the Face Recognition Grand Challenge data corpus, the largest and most established data corpus for face recognition currently available. Our results indicate that our algorithm exhibits high levels of accuracy and robustness, and is not gender biased. In addition, it is minimally affected by facial expressions.

Original languageEnglish (US)
Title of host publication2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 2005 - Workshops
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)0769526608
DOIs
StatePublished - 2005
Event2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 2005 - Workshops - San Diego, United States
Duration: Sep 21 2005Sep 23 2005

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
Volume2005-September
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 2005 - Workshops
Country/TerritoryUnited States
CitySan Diego
Period9/21/059/23/05

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering

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