Electro-stress migration induced instability at heterogenous interfaces

Engineering & Materials Science

• Chemical potential 100%
• Linear stability analysis 48%
• Critical currents 48%
• Electromigration 43%
• Electric currents 38%
• Current density 32%
• Integrated circuits 30%
• Mass transfer 29%
• Elastic moduli 28%
• Metals 21%

Chemistry

• Chemical Potential 75%
• Atomic Mass 45%
• Current 43%
• Mass Transfer 27%
• Current Density 24%
• Metal 15%

Physics & Astronomy

• periodic variations 24%
• perturbation 18%
• half planes 16%
• atomic weights 16%
• electromigration 15%
• electric current 13%
• integrated circuits 12%
• critical current 12%
• voids 11%
• modulus of elasticity 10%
• current density 9%
• causes 8%
• metals 6%