Dynamic characterization of nanoelectromechanical oscillators by atomic force microscopy

Keyphrases

• Dynamic Characterization 100%
• Atomic Force Microscopy 100%
• Nanoelectromechanical Systems 100%
• Imaging Data 33%
• Atomic Force Microscope 33%
• Dynamic Behavior 33%
• Mechanical Structure 33%
• Dynamic Response 33%
• Resonant Response 33%
• Optical Excitation 33%
• Micromechanics 33%
• Van Der Waals Force 33%
• Resonance Behavior 33%
• Measurement Results 33%
• Piezoelectric Transducer 33%
• Vibrational Spectra 33%
• Noncontact Atomic Force Microscopy 33%
• Dynamic Detection 33%
• Optical Detection 33%
• Intermittent Contact 33%
• Interaction Initiation 33%
• Direct Coupling 33%
• Contact Force 33%
• Derjaguin 33%
• System Measurement 33%
• Atomic Force Microscope Probe 33%
• Nanomechanical Structure 33%
• Vibrational Characteristics 33%
• Coupled System 33%
• Microscopy System 33%
• Contact Imaging 33%

Engineering

• Oscillator 100%
• Atomic Force Microscopy 100%
• Atomic Force Microscope 100%
• Nanoelectromechanical System 66%
• Good Agreement 33%
• Nanoscale 33%
• Mechanical Structure 33%
• Dynamic Response 33%
• Transducer 33%
• Dynamic Behavior 33%
• Measurement System 33%
• Coupled System 33%
• Data Show 33%
• Piezoelectric 33%
• Measured Spectrum 33%
• Contact Force 33%
• Derjaguin-Muller-Toporov Model 33%