Determination of nonradiative surface layer thickness in quantum dots etched from single quantum well GaAs/AlGaAs

E. M. Clausen, H. G. Craighead, J. M. Worlock, J. P. Harbison, L. M. Schiavone, L. Florez, B. Van der Gaag

Research output: Contribution to journal › Article › peer-review

70 Scopus citations

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Engineering

Chemical Engineering

Physics

Material Science