TY - JOUR
T1 - Correction for partial volume averaging in the quantification of radiopaque nanomaterial-embedded resorbable polymers
AU - Melancon, Adam D.
AU - Jacobsen, Megan
AU - Damasco, Jossana
AU - Perez, Joy
AU - Bernardino, Marvin
AU - Valentin, Erin San
AU - Court, Karem A.
AU - Godin, Biana
AU - Layman, Rick
AU - Melancon, Marites P.
N1 - Publisher Copyright:
© 2024 The Author(s). Published by IOP Publishing Ltd.
PY - 2024/9
Y1 - 2024/9
N2 - Resorbable inferior vena cava (IVC) filters require embedded contrast for image-guided placement and integrity monitoring. We calculated correction factors to account for partial volume averaging of thin nanoparticle (NP)-embedded materials, accounting for object and slice thicknesses, background signal, and nanoparticle concentration. We used phantoms containing polycaprolactone disks embedded with bismuth (Bi) or ytterbium (Yb): 0.4- to 1.2-mm-thick disks of 20 mg ml−1 NPs (thickness phantom), 0.4-mm-thick disks of 0-20 mg ml−1 NPs in 2 mg ml−1 iodine (concentration phantom), and 20 mg ml−1 NPs in 0.4-mm-thick disks in 0-10 mg ml−1 iodine (background phantom). Phantoms were scanned on a dual-source CT with 80, 90, 100, and 150 kVp with tin filtration and reconstructed at 1.0- to 1.5-mm slice thickness with a 0.1-mm interval. Following scanning, disks were processed for inductively coupled plasma optical emission spectrometry (ICP-OES) to determine NP concentration. Mean and maximum CT numbers (HU) of all disks were measured over a 0.5-cm2 area for each kVp. HU was converted to concentration using previously measured calibrations. Concentration measurements were corrected for partial volume averaging by subtracting residual slice background and extrapolating disk thickness to both nominal and measured slice sensitivity profiles (SSP, mm). Slice thickness to agreement (STTA, mm) was calculated by replacing the CT-derived concentrations with ICP-OES measurements and solving for thickness. Slice thickness correction factors improved agreement with ICP-OES for all measured data. Yb corrections resulted in lower STTA than Bi corrections in the concentration phantom (1.01 versus 1.31 STTA/SSP, where 1.0 is perfect agreement), phantoms with varying thickness (1.30 versus 1.87 STTA/SSP), and similar ratio in phantoms with varying background iodine concentration (1.34 versus 1.35 STTA/SSP). All measured concentrations correlated strongly with ICP-OES and all corrections for partial volume averaging increased agreement with ICP-OES concentration, demonstrating potential for monitoring the integrity of thin IVC resorbable filters with CT.
AB - Resorbable inferior vena cava (IVC) filters require embedded contrast for image-guided placement and integrity monitoring. We calculated correction factors to account for partial volume averaging of thin nanoparticle (NP)-embedded materials, accounting for object and slice thicknesses, background signal, and nanoparticle concentration. We used phantoms containing polycaprolactone disks embedded with bismuth (Bi) or ytterbium (Yb): 0.4- to 1.2-mm-thick disks of 20 mg ml−1 NPs (thickness phantom), 0.4-mm-thick disks of 0-20 mg ml−1 NPs in 2 mg ml−1 iodine (concentration phantom), and 20 mg ml−1 NPs in 0.4-mm-thick disks in 0-10 mg ml−1 iodine (background phantom). Phantoms were scanned on a dual-source CT with 80, 90, 100, and 150 kVp with tin filtration and reconstructed at 1.0- to 1.5-mm slice thickness with a 0.1-mm interval. Following scanning, disks were processed for inductively coupled plasma optical emission spectrometry (ICP-OES) to determine NP concentration. Mean and maximum CT numbers (HU) of all disks were measured over a 0.5-cm2 area for each kVp. HU was converted to concentration using previously measured calibrations. Concentration measurements were corrected for partial volume averaging by subtracting residual slice background and extrapolating disk thickness to both nominal and measured slice sensitivity profiles (SSP, mm). Slice thickness to agreement (STTA, mm) was calculated by replacing the CT-derived concentrations with ICP-OES measurements and solving for thickness. Slice thickness correction factors improved agreement with ICP-OES for all measured data. Yb corrections resulted in lower STTA than Bi corrections in the concentration phantom (1.01 versus 1.31 STTA/SSP, where 1.0 is perfect agreement), phantoms with varying thickness (1.30 versus 1.87 STTA/SSP), and similar ratio in phantoms with varying background iodine concentration (1.34 versus 1.35 STTA/SSP). All measured concentrations correlated strongly with ICP-OES and all corrections for partial volume averaging increased agreement with ICP-OES concentration, demonstrating potential for monitoring the integrity of thin IVC resorbable filters with CT.
KW - dual-energy computed tomography
KW - medical device
KW - nanoparticles
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U2 - 10.1088/2057-1976/ad6a66
DO - 10.1088/2057-1976/ad6a66
M3 - Article
C2 - 39094587
AN - SCOPUS:85201281405
SN - 2057-1976
VL - 10
JO - Biomedical Physics and Engineering Express
JF - Biomedical Physics and Engineering Express
IS - 5
M1 - 055021
ER -