Abstract
An order of magnitude improvement in the precision of measurements of internal optical mode losses to better than 0.1cm-1 is demonstrated using a modulated segmented contact method.
| Original language | English (US) |
|---|---|
| Title of host publication | Conference on Lasers and Electro-Optics Europe - Technical Digest |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Volume | 2015-August |
| ISBN (Print) | 9781557529688 |
| State | Published - Aug 10 2015 |
| Event | Conference on Lasers and Electro-Optics, CLEO 2015 - San Jose, United States Duration: May 10 2015 → May 15 2015 |
Other
| Other | Conference on Lasers and Electro-Optics, CLEO 2015 |
|---|---|
| Country/Territory | United States |
| City | San Jose |
| Period | 5/10/15 → 5/15/15 |
Keywords
- Absorption
- Current measurement
- Extraterrestrial measurements
- Measurement uncertainty
- Optical modulation
- Optical scattering
- Optical variables measurement
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Atomic and Molecular Physics, and Optics
- Electronic, Optical and Magnetic Materials
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